VDI/VDE 5575 BLATT 4
X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors
inactive
| Organization: | VDI |
| Publication Date: | 1 August 2011 |
| Status: | inactive |
| Page Count: | 19 |
| ICS Code (Optical measuring instruments): | 17.180.30 |
scope:
This guideline deals with reflective X-ray optical systems, which use total reflection as well as Bragg reflection on inner interfaces of a multilayer structure to influence the spectral composition and the directional characteristic.
Document History
September 1, 2018
X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
This standard addresses users, developers and producers of X-ray mirrors. Typical application fields are laboratory equipment using X-rays, e.g., for diffraction, spectroscopy, scattering,...
October 1, 2017
X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
A description is not available for this item.
VDI/VDE 5575 BLATT 4
August 1, 2011
X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors
This guideline deals with reflective X-ray optical systems, which use total reflection as well as Bragg reflection on inner interfaces of a multilayer structure to influence the spectral composition...