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BSI - BS PD IEC/TR 61967-1-1

Integrated circuits - Measurement of electromagnetic emissions Part 1-1: General conditions and definitions - Near-field scan data exchange format

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Organization: BSI
Publication Date: 30 September 2015
Status: active
Page Count: 68
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS PD IEC/TR 61967-1-1
September 30, 2015
Integrated circuits - Measurement of electromagnetic emissions Part 1-1: General conditions and definitions - Near-field scan data exchange format
A description is not available for this item.
June 30, 2010
Integrated circuits - Measurement of electromagnetic emissions Part 1-1: General conditions and definitions - Near-field scan data exchange format
A description is not available for this item.

References

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