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IEC 61189-3-719

Test methods for electrical materials, printed boards and other interconnection structures and assemblies – Part 3-719: Test methods for interconnection structures (printed boards) – Monitoring of single plated-through hole (PTH) resistance change during temperature cycling

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Organization: IEC
Publication Date: 1 January 2016
Status: active
Page Count: 26
ICS Code (Printed circuits and boards): 31.180
scope:

This part of IEC 61189 specifies a test method to monitor the resistance of single platedthrough holes (PTHs) in printed circuit boards (PCBs) to determine the PTH durability under thermo-mechanical stress induced by temperature cycling.

Document History

IEC 61189-3-719
January 1, 2016
Test methods for electrical materials, printed boards and other interconnection structures and assemblies – Part 3-719: Test methods for interconnection structures (printed boards) – Monitoring of single plated-through hole (PTH) resistance change during temperature cycling
This part of IEC 61189 specifies a test method to monitor the resistance of single platedthrough holes (PTHs) in printed circuit boards (PCBs) to determine the PTH durability under thermo-mechanical...

References

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