DOD - SMD 5962-97616
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON
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| Organization: | DOD |
| Publication Date: | 24 February 2016 |
| Status: | active |
| Page Count: | 17 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
June 21, 2022
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-97616
February 24, 2016
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
September 8, 2010
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 19, 2003
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON
A description is not available for this item.
August 2, 2000
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON
A description is not available for this item.
September 9, 1997
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, DUAL POSITIVE EDGE-TRIGGERED D-TYPE FLIP FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...