Diode Standards

01598c-000000-000000 1 Scope 1.1 These requirements apply to light-emitting diode (LED) retrofit kits that are intended to retrofit existing light sources or other components in previously installed luminaires that already comply with one of the standards in 3. 1.2 These kits are intended...

4.1 The design of a photovoltaic module or system intended to provide safe conversion of the sun's radiant energy into useful electricity must take into consideration the possibility of partial shadowing of the module(s) during operation. This test method describes a procedure for verifying that...

1.1 This guide covers the evaluation, qualification, and quantification of digital neutron images. These images can be acquired by many methods, including: neutron sensitive imaging plates (Computed Radiography - CR), Digital Detector Arrays - DDA's (amorphous silicon, CMOS, CCD, etc.),...

00962a-000000-000000 1 Scope 1.1 These requirements cover indoor use cord and plug connected of permanently connected, furniture power distribution units (FPDU) rated 250 V AC or less and 20 Amperes or less. An FPDU may provide one or more receptacle outlets, inclusive of one current tap integral...

013630-000000-000000 1 Scope 1.1 These requirements cover indoor use cord and plug connected, relocatable power taps (RPT) rated 250 V AC or less and 20 Amperes or less. A RPT may include an integral Class 2 power supply with an integral lead and/or connector(s) output. In accordance with the...

1.1 This test method covers the testing of the spectral bandwidth and wavelength accuracy of fluorescence spectrometers that use a monochromator for emission wavelength selection and photomultiplier tube detection. This test method can be applied to instruments that use multi-element detectors,...

4.1 Wavenumber calibration is an important part of Raman analysis. The calibration of a Raman spectrometer is performed or checked frequently in the course of normal operation and even more often when working at high resolution. To date, the most common source of wavenumber values is either...

015570-000000-000000 1 Scope 1.1 These requirements apply to semiconductor devices of the isolated-mounting type - thyristors, transistors, diodes, and the like, and hybrid modules consisting of combinations of these devices. 1.2 The term isolation, as used in this standard, refers to the...

3.1 Calibration of the responsivity of the detection system for emission (EM) as a function of EM wavelength (?EM), also referred to as spectral correction of emission, is necessary for successful quantification when intensity ratios at different EM wavelengths are being compared or when the true...

1.1 This test method is for the online determination of hydrogen sulfide (H2S) in natural gas using tunable diode laser absorption spectroscopy (TDLAS) analyzers also known as a "TDL analyzers." The particular wavelength for H2S measurement varies by manufacturer, typically between 1000 and...

1.1 This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of...

5.1 This practice may be applied when tristimulus colorimeters are used to measure the colors produced on self-luminous video display devices such as CRTs and flat-panel displays, including electroluminescent (EL) panels, light emitting diodes (LEDs) field emission displays (FEDs), and...

5.1 Water vapor is ubiquitous and a basic contaminant in compressed air. It cannot be eliminated but shall be controlled. Knowledge of the vapor content of compressed air is important for industrial processes to ensure that compressors that generate compressed air are functioning properly and...

1.1 This practice covers the procedure for the post installation verification and acceptance of buried pipe deformation using a visible rotating laser light diode(s), a pipeline and conduit inspection analog or digital CCTV camera system and image processing software. The combination CCTV...

1.1 This test method covers online determination of vapor phase moisture concentration in natural gas using a tunable diode laser absorption spectroscopy (TDLAS) analyzer also known as a "TDL analyzer." The particular wavelength for moisture measurement varies by manufacturer; typically...

This SAE Recommended Practice is intended as a guide toward standard practice and is subject to change to keep pace with experience and technical advances. This document establishes additional performance requirements specifically for road illumination devices using light emitting diode...

Scope. This specification covers the performance requirements for silicon, high voltage, fast recovery power rectifier diodes. Four levels of product assurance are provided for each device as specified in MIL-PRF-19500.

Scope. This specification covers the performance requirements for silicon, high voltage, fast recovery power rectifier diodes. Four levels of product assurance are provided for each device as specified in MIL-PRF-19500.