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Electron Microscope ASTM Standards

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Basic Microscope Techniques
February 2, 1971 - CPC

Features Preface 1. The Compound Microscope 2. Methods of illuminating and Using the Microscope 3. The Stereomicroscope 4. Measuring and Counting with the Microscope 5. Preparing Mounts for the Microscope 6. Collecting and Preparing Pure Cultures of Various Organisms 7....

MIL-M-37869 - MICROSCOPE, OPTICAL, BINOCULAR
April 28, 1978 - NPFC

This specification covers a quadruple nosepiece, inclined binocular microscope with a built-in variable light source.

ASME B1.11 - Microscope Objective Thread
January 1, 1958 - ASME

This standard covers the screw thread used for mounting the objective assembly to the body or lens turret of microscopes. It is based on, and intended to be interchangeable with, the screw thread introduced and adopted many years ago by the Royal Microscopical Society of Great Britain,...

A-A-54386 - MICROSCOPE, OPTICAL (BINOCULAR, BRIGHTFIELD)
April 22, 1991 - NPFC

The General Services Administration has authorized the use of this Commercial Item Description. This Commercial Item Description covers a brightfield binocular microscope for histopathological and pathological studies for use inside medical laboratories and for outside field use.

JIS B 7148 - Microscope eyepieces
February 1, 1992 - JSA
A description is not available for this item.
A-A-54970 - MICROSCOPE, OPTICAL
NPFC
A description is not available for this item.
NNN-S-450 - SLIDE, MICROSCOPE
NPFC
A description is not available for this item.
MS 36148 - DESK, MICROSCOPE
NPFC
A description is not available for this item.
A-A-50831 - SLIDE, MICROSCOPE
NPFC
A description is not available for this item.
ASTM E210 - Standard Specification for Microscope Objective Thread
September 30, 1963 - ASTM

This standard covers the screw thread used for mounting the objective assembly to the body or lens turret of microscopes. It is based on, and intended to be interchangeable with, the screw thread introduced and adopted many years ago by the Royal Microscopical Society of Great Britain,...

A-A-54869 - MICROSCOPE, SURGICAL Binocular, Multi-Disciplinary
May 17, 1993 - NPFC

The General Services Administration has authorized the use of this Commercial Item Description. This Commercial Item Description covers a multi-disciplinary surgical microscope with interchangeable objectives.

ASTM E210-63(2005) - Standard Specification for Microscope Objective Thread
May 1, 2005 - ASTM International

1.1 This standard covers the screw thread used for mounting the objective assembly to the body or lens turret of microscopes. It is based on, and intended to be interchangeable with, the screw thread introduced and adopted many years ago by the Royal Microscopical Society of Great Britain,...

ASTM E210-63(1999)e1 - Standard Specification for Microscope Objective Thread
December 10, 1999 - ASTM International

1.1 This standard covers the screw thread used for mounting the objective assembly to the body or lens turret of microscopes. It is based on, and intended to be interchangeable with, the screw thread introduced and adopted many years ago by the Royal Microscopical Society of Great Britain,...

ASTM E210-63(2010) - Standard Specification for Microscope Objective Thread
July 1, 2010 - ASTM International

1.1 This standard covers the screw thread used for mounting the objective assembly to the body or lens turret of microscopes. It is based on, and intended to be interchangeable with, the screw thread introduced and adopted many years ago by the Royal Microscopical Society of Great Britain,...

ASTM F728 - Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
June 26, 1981 - ASTM

This practice covers the preparation of an optical microscope for dimensional measurements. It is intended for preparing an optical microscope to measure the width of lines, in the range from 0.5 to 12 µm, inclusive, on hardsurface photomasks and processed silicon wafers. This...

ISO 15632 - Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
February 1, 2021 - ISO

This document defines the most important quantities that characterize an energy-dispersive X‑ray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts. This document is only applicable to spectrometers with semiconductor detectors...

ASTM F728-81(1997)e1 - Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
January 1, 1987 - ASTM International

1.1 This practice covers the preparation of an optical microscope for dimensional measurements. It is intended for preparing an optical microscope to measure the width of lines, in the range from 0.5 to 12 [mu]m, inclusive, on hard-surface photomasks and processed silicon wafers. 1.2...

ASTM E1951-14(2019) - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
November 1, 2019 - ASTM International

4.1 These methods can be used to determine magnifications as viewed through the eyepieces of light microscopes. 4.2 These methods can be used to calibrate microscope magnifications for photography, video systems, and projection stations. 4.3 Reticles may be calibrated as independent...

ASTM E1951-14 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
November 1, 2014 - ASTM International

4.1 These methods can be used to determine magnifications as viewed through the eyepieces of light microscopes. 4.2 These methods can be used to calibrate microscope magnifications for photography, video systems, and projection stations. 4.3 Reticles may be calibrated as independent...

ASTM E1951 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
November 1, 2014 - ASTM

This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material microstructures....

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