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ASTM D7356 - Standard Test Method for Accelerated Acid Etch Weathering of Automotive Clearcoats Using a Xenon-Arc Exposure Device
June 1, 2007 - ASTM

This test method covers an accelerated exposure test intended to simulate defects in automotive clearcoats caused by acid rain2 that occur at the Jacksonville, Florida exposure site. Exterior exposures at an acid rain test location in Jacksonville, Florida produce etch defects that range...

ASTM D7356/D7356M - Standard Test Method for Accelerated Acid Etch Weathering of Automotive Clearcoats Using a Xenon-Arc Exposure Device
June 1, 2013 - ASTM

This test method covers an accelerated exposure test intended to simulate defects in automotive clearcoats caused by acid rain2 that occur at the Jacksonville, Florida exposure site. Exterior exposures at an acid rain test location in Jacksonville, Florida produce etch defects that range...

ASTM A262 - Standard Practices for Detecting Susceptibility to Intergranular Attack in Austenitic Stainless Steels
September 1, 2015 - ASTM

These practices cover the following five tests: Practice A-Oxalic Acid Etch Test for Classification of Etch Structures of Austenitic Stainless Steels (Sections 4 to 13, inclusive), Practice B-Ferric Sulfate-Sulfuric Acid Test for Detecting Susceptibility to Intergranular Attack in...

ASTM F1404 - Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique
May 15, 1992 - ASTM

This test method is used to determine whether an ingot or wafer of gallium arsenide is monocrystalline and, if so, to measure the etch pit density and to judge the nature of crystal imperfections. To the extent possible, it follows the corresponding test method for silicon, Test Method F 47....

ASTM E2431 - Standard Practice for Determining the Resistance of Single Glazed Annealed Architectural Flat Glass to Thermal Loadings
April 1, 2012 - ASTM

This practice covers a procedure to determine the resistance of annealed architectural flat glass to thermally induced stresses caused by exposure to sun and shadows for a specified probability of breakage (Pb). Proper use of this procedure is intended to reduce the possibility of thermal breakage...

ASTM F416 - Standard Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers
July 15, 1994 - ASTM

1. Scope 1.1 This test method covers detection of crystalline defects in the surface region of silicon wafers which are induced or enhanced by oxidation cycles encountered in device processing. Atmospheric pressure oxidation cycles representative of bipolar, MOS, and CMOS technologies are included....

ASTM A561 (R) - STANDARD PRACTICE FOR MACROETCH TESTING OF TOOL STEEL BARS
October 1, 2008 - ASTM

This practice for macroetch testing has been found to be a useful and reliable method for evaluating the quality of tool steel bars. It is used as a quality control and inspection test to reveal by deep acid etching the macrostructure in specimens cut from bars and to show the presence of such...

ASTM A561 - Standard Practice for Macroetch Testing of Tool Steel Bars
October 1, 2008 - ASTM

This practice for macroetch testing has been found to be a useful and reliable method for evaluating the quality of tool steel bars. It is used as a quality control and inspection test to reveal by deep acid etching the macrostructure in specimens cut from bars and to show the presence of such...

ASTM F1049 - Standard Practice for Shallow Etch Pit Detection on Silicon Wafers
December 10, 2002 - ASTM

This practice is used to detect shallow etch pits, which may be related to the level of metallic impurities near the surface of silicon epitaxial or polished wafers. This practice is not recommended for use in defect density evaluations, but as a subjective means of estimating defect...

ASTM F1727 - Standard Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers
December 10, 2002 - ASTM

This practice covers the detection of crystalline defects in the surface region of silicon wafers. The defects are induced or enhanced by oxidation cycles encountered in normal device processing. An atmospheric pressure, oxidation cycle representative of bipolar, metal-oxide-silicon (MOS) and CMOS...

ASTM F399 - Standard Test Method for Thickness of Heteroepitaxial or Polysilicon Layers
December 10, 2000 - ASTM

1. Scope 1.1 This test method covers the determination of thickness of silicon heteroepitaxial or polysilicon layers deposited under conditions such that the interface region between the deposited layer and the substrate is less than 20-nm thick. Interface regions 20 nm and thicker rarely occur,...

ASTM D5671 - Standard Practice for Polishing and Etching Coal Samples for Microscopical Analysis by Reflected Light
July 15, 1995 - ASTM

This practice covers laboratory procedures for preparing an etched, polished surface of granular and block samples of coal for examination with a microscope using reflected light illumination. The values stated in SI units are to be regarded as standard. No other units of measurement are...

ASTM D1867 - Standard Specification for Copper-Clad Thermosetting Laminates for Printed Wiring
November 1, 2013 - ASTM

This specification covers twelve grades of thermosetting laminate with copper foil bonded to one or both surfaces. These combination forms are intended primarily for use in fabrication of printed (etched) wiring or circuit boards. The values stated in inch-pound units are to be regarded as...

SAE ARP1923 - Qualification and Certification of Etch Inspectors
May 1, 2013 - SAE

This specification covers the requirements for qualification, requalification, and certification of etch inspectors.

ASTM F1809 - Standard Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon
December 10, 2002 - ASTM

This guide covers the formulation, selection, and use of chemical solutions developed to reveal structural defects in silicon wafers. Etching solutions identify crystal defects that adversely affect the circuit performance and yield of silicon devices. Sample preparation, temperature control,...

ASTM F1621 - Standard Practice for Determining the Positional Accuracy Capabilities of a Scanning Surface Inspection System
February 10, 1996 - ASTM

1. Scope 1.1 This practice covers the determination of the accuracy with which a scanning surface inspection system (SSIS) reports the positions of localized light scatterers on a silicon wafer surface. 1.2 This practice includes procedures to separate the influences of wafer handling and wafer...

DS/ISO 14104 - Gears – Surface temper etch inspection after grinding, chemical method
April 10, 2017 - DS

ISO 14104:2017 specifies procedures and requirements for the detection and classification of localized overheating on ground surfaces by chemical etch methods. The process described in this document is typically used on ground surfaces; however, it is also useful for the detection of surface...

ISO 14104 - Gears - Surface temper etch inspection after grinding, chemical method
April 1, 2017 - ISO

This document specifies procedures and requirements for the detection and classification of localized overheating on ground surfaces by chemical etch methods. The process described in this document is typically used on ground surfaces; however, it is also useful for the detection of surface...

FORD WSS-M15J18-A1 - PAINT, TWO LAYER STANDARD SOFT TOUCH COLOR COAT FOR PLASTIC, BASE/SOFT CLEAR COAT SYSTEM, INTERIOR ***TO BE USED WITH FORD WSS-M99P1111-A***
October 4, 2018 - FORD

The material defined by this specification is a two layer pigmented soft touch coating system suitable for first surface application to interior plastic parts and laser etch applications. Haptics as defined by Ford Design.

AGMA ISO 14104 - Gears – Surface Temper Etch Inspection After Grinding, Chemical Method
January 1, 2017 - AGMA

This document specifies procedures and requirements for the detection and classification of localized overheating on ground surfaces by chemical etch methods. The process described in this document is typically used on ground surfaces; however, it is also useful for the detection of surface...

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