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PCMCIA DESIGNING - PCMCIA DESIGNING WITH FLASH MEMORY
PCMCIA
A description is not available for this item.
IEEE 1890 - Error Correction Coding of Flash Memory Using Low-Density Parity Check Codes
September 27, 2018 - IEEE
A description is not available for this item.
SMD 5962-12204 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 64-MEG, USERCONFIGURABLE, 3.3 VOLT, NOR FLASH MEMORY, MONOLITHIC SILICON
August 13, 2013 - DOD

This drawing documents two product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38535. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are...

SMD 5962-94612 - MICROCIRCUIT, HYBRID, MEMORY, FLASH ERASABLE/PROGRAMMABLE READ ONLY MEMORY, 512K x 32-BIT
October 17, 2017 - DOD

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are...

JEDEC JESD 220-1 - Universal Flash Storage (UFS) Unified Memory Extension Version 1.1
March 1, 2016 - JEDEC

This document provides a comprehensive definition of the unified memory support for UFS. It also provides some details in how to utilize the unified memory for realizing high performance in UFS devices.

SMD 5962-97610 - MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, FLASH EPROM, 2M X 16-BIT
March 7, 2016 - DOD

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels is...

SMD 5962-96690 - MICROCIRCUIT, MEMORY, DIGITAL, FLASH EPROM, 128K X 8-BIT, MONOLITHIC SILICON
April 5, 2018 - DOD

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are...

SMD 5962-97609 - MICROCIRCUIT, MEMORY, DIGITAL, FLASH EPROM, 2M X 8-BIT, MONOLITHIC SILICON
March 7, 2016 - DOD

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels is...

SMD 5962-96692 - MICROCIRCUIT, MEMORY, DIGITAL, FLASH EPROM, 512K x 8-BIT, MONOLITHIC SILICON
August 24, 2011 - DOD

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are...

SMD 5962-94716 - MICROCIRCUIT, HYBRID, DIGITAL, FLASH ERASABLE/PROGRAMMABLE READ ONLY MEMORY, 128K x 32-BIT
October 25, 2016 - DOD

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels is...

Nanocrystals in Nonvolatile Memory
September 13, 2018 - CRC

In recent years, utilization of the abundant advantages of quantum physics, quantum dots, quantum wires, quantum wells, and nanocrystals has attracted considerable scientific attention in the field of nonvolatile memory. Nanocrystals are the driving element that have brought the nonvolatile...

JEDEC JESD 223-1 - Universal Flash Storage Host Controller Interface (UFSHCI), Unified Memory Extension Version 1.1
March 1, 2016 - JEDEC

This document provides a comprehensive definition of the requirements for implementation of a UFS Host Controller, which supports the optional Unified Memory extension.

JEDEC JESD 84-C01 - MultiMediaCard (MMC) Card Mechanical Standard
June 1, 2007 - JEDEC

This document is a mechanical product specification for a removable non-volatile flash memory device using the MMC interface version 4.2. The electrical specification for the MMC interface version 4.2 is document JESD84-B42.

JEDEC JESD 230 - NAND Flash Interface Interoperability
October 1, 2016 - JEDEC

This standard was jointly developed by JEDEC and the Open NAND Flash Interface Workgroup, hereafter referred to as ONFI. This standard defines a standard NAND flash device interface interoperability standard that provides means for system be designed that can support Asynchronous SDR,...

JEDEC JESD 216 - Serial Flash Discoverable Parameters (SFDP)
November 1, 2018 - JEDEC

The SFDP standard defines the structure of the SFDP database within the memory device and methods used to read its data. The JEDEC-defined header with Parameter ID FF00h and the related Basic Parameter Table is mandatory. This header and table provide basic information for a Serial...

SMD 5962-95557 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
November 1, 2017 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-97599 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
September 26, 2017 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-97597 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
September 19, 2017 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

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