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1.1 This terminology standard defines abbreviations and terms specific to uninsulated electrical conductors. For terms relating to superconductors, see Terminology B713. 1.2 This international standard was developed in accordance with internationally recognized principles on...
4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test Method D4496.
5.1 This practice is based on the use of electrical resistance as an indicator of contact performance. This is the fundamental physical attribute that reflects the condition of the electrical contact interface(s) within a connection. For practical current-carrying electrical...
1.1 This practice describes the practices and factors considered to be most important in the measurement of electrical contact noise of sliding contacts. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the...
1.1 This guide covers the major variables which affect the rate of arc erosion of electrical contact materials and serves as a guide in developing more detailed specifications for arc-erosion tests. 1.2 Arc erosion testing involves some vaporization of material. It is the responsibility of...
This specification covers the requirements for electrodeposited rhodium coatings for engineering applications, usually employed for their corrosion resistance, stable electrical contact resistance, wear resistance, reflectivity, and heat resistance. Coating shall be classified based on their...
This specification establishes the requirements for electrodeposited palladium coatings for use in engineering applications. This specification also covers composite coatings of palladium with a thin gold overplate for applications involving electrical contacts. The plating system shall...
1.1 This practice provides the minimum requirements for nondestructive radiographic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical devices, and the materials used for construction of these items. 1.2 This practice covers the...
1.1 This test method covers the determination of the electrical resistivity of metallic electrical conductor material. It provides for an accuracy of ±0.30 % on test specimens having a resistance of 0.00001 Ω (10 µΩ) or more. Weight resistivity accuracy may be adversely affected by...
This test method covers the determination of the electrical resistivity of metallic electrical conductor material. It provides for an accuracy of 60.30 % on test specimens having a resistance of 0.00001 Ω (10 μΩ) or more. Weight resistivity accuracy may be adversely affected by...
1.1 This test method covers the determination of electrical resistance and electrical resistivity of materials that are generally categorized as moderately conductive and are neither good electrical insulators nor good conductors. 1.2 This test method applies to the materials...
1.1 This test method covers the determination of electrical resistance and electrical resistivity of materials that are generally categorized as moderately conductive and are neither good electrical insulators nor good conductors. 1.2 This test method applies to the materials...
This test method covers the determination of electrical resistance and electrical resistivity of materials that are generally categorized as moderately conductive and are neither good electrical insulators nor good conductors. This test method applies to the materials that...
1.1 These test methods define procedures for the relative characterization of conductor material connectability on the basis of measurements of parameters important to the design and performance of electrical contacts and connections to and with such conductors for both power and signal...
1.1 This test method defines a resistance probing test for detecting the presence of foreign matter on Printed Wiring Board (PWB) contacts or fingers that adversely affects electrical performance. This test method is defined specifically for such fingers coated with gold. Application of this...
1.1 This specification covers crosslinked and thermoplastic extruded semi-conducting, conductor, and insulation shielding materials for electrical wires and cables. 1.2 In many instances, the electrical properties of the shielding material are strongly dependent on processing...
5.1 Eddy current instrumentation provides timely and useful information regarding the acceptability of copper and aluminum rod for quality control purposes, as well as providing for early warning that unacceptable rod is being produced. Eddy current testing is a nondestructive method of locating...
This practice covers the procedures that shall be followed in electromagnetic (eddy current) examination of copper and aluminum redraw rods for detecting discontinuities or imperfections of a severity likely to cause failure or markedly impair surface quality of the rod. These procedures are...
4.1 Application of an EL lamp (or other diffuse lighting source) to illuminate a device has a functional purpose and must meet specifications to satisfy the functional requirements of the device. 4.2 Illumination of the device or application can be affected by variations in the quality, efficiency,...
This specification covers the requirements for rod drawing stock produced from electrolytic tough-pitch or oxygen-free coppers and is suitable for further fabrication into electrical conductors. The rod shall be fabricated from copper of such quality and purity. Copper of special qualities,...
