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ASTM E1951 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
November 1, 2014 - ASTM

This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material microstructures....

Basic Microscope Techniques
February 2, 1971 - CPC

Features Preface 1. The Compound Microscope 2. Methods of illuminating and Using the Microscope 3. The Stereomicroscope 4. Measuring and Counting with the Microscope 5. Preparing Mounts for the Microscope 6. Collecting and Preparing Pure Cultures of Various Organisms 7....

ASTM F728 - Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
June 26, 1981 - ASTM

This practice covers the preparation of an optical microscope for dimensional measurements. It is intended for preparing an optical microscope to measure the width of lines, in the range from 0.5 to 12 ┬Ám, inclusive, on hardsurface photomasks and processed silicon wafers. This...

MIL-M-37869 - MICROSCOPE, OPTICAL, BINOCULAR
April 28, 1978 - NPFC

This specification covers a quadruple nosepiece, inclined binocular microscope with a built-in variable light source.

ASME B1.11 - Microscope Objective Thread
January 1, 1958 - ASME

This standard covers the screw thread used for mounting the objective assembly to the body or lens turret of microscopes. It is based on, and intended to be interchangeable with, the screw thread introduced and adopted many years ago by the Royal Microscopical Society of Great Britain,...

A-A-54386 - MICROSCOPE, OPTICAL (BINOCULAR, BRIGHTFIELD)
April 22, 1991 - NPFC

The General Services Administration has authorized the use of this Commercial Item Description. This Commercial Item Description covers a brightfield binocular microscope for histopathological and pathological studies for use inside medical laboratories and for outside field use.

ISO 27911 - Surface chemical analysis - Scanningprobe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
August 1, 2011 - ISO

This International Standard describes a method for determining the spatial (lateral) resolution of an apertured near-field scanning optical microscope (NSOM) by imaging an object with a size much smaller than the expected resolution. It is applicable to aperture-type NSOMs operated in the...

JIS B 7148 - Microscope eyepieces
February 1, 1992 - JSA
A description is not available for this item.
NNN-S-450 - SLIDE, MICROSCOPE
NPFC
A description is not available for this item.
MS 36148 - DESK, MICROSCOPE
NPFC
A description is not available for this item.
A-A-50831 - SLIDE, MICROSCOPE
NPFC
A description is not available for this item.
A-A-54970 - MICROSCOPE, OPTICAL
NPFC
A description is not available for this item.
A-A-54869 - MICROSCOPE, SURGICAL Binocular, Multi-Disciplinary
May 17, 1993 - NPFC

The General Services Administration has authorized the use of this Commercial Item Description. This Commercial Item Description covers a multi-disciplinary surgical microscope with interchangeable objectives.

ISO 11952 - Surface chemical analysis - Scanningprobe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
January 22, 2014 - ISO

This International Standard specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use,...

ISO 25498 - Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
March 1, 2018 - ISO

This document specifies the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies to test areas of micrometres and sub-micrometres in size. The minimum diameter of the selected...

ASTM E766 - Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
January 1, 2014 - ASTM

This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions.2 Therefore, this practice must be applied...

ISO 13083 - Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
August 15, 2015 - ISO

This International Standard describes a method for measuring the spatial (lateral) resolution of scanning capacitance microscopes (SCMs) or scanning spreading resistance microscopes (SSRMs), which are widely used in imaging the distribution of carriers and other electrical properties...

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