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ASTM E1951-14 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
November 1, 2014 - ASTM International

4.1 These methods can be used to determine magnifications as viewed through the eyepieces of light microscopes. 4.2 These methods can be used to calibrate microscope magnifications for photography, video systems, and projection stations. 4.3 Reticles may be calibrated as independent...

ASTM E1951-02(2007) - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
October 1, 2007 - ASTM International

These methods can be used to determine magnifications as viewed through the eyepieces of light microscopes. These methods can be used to calibrate microscope magnifications for photography, video systems, and projection stations. Reticles may be calibrated as independent articles and...

Basic Microscope Techniques
February 2, 1971 - CPC

Features Preface 1. The Compound Microscope 2. Methods of illuminating and Using the Microscope 3. The Stereomicroscope 4. Measuring and Counting with the Microscope 5. Preparing Mounts for the Microscope 6. Collecting and Preparing Pure Cultures of Various Organisms 7....

ASTM E1951-02 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
April 10, 2002 - ASTM International

1.1 This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material...

ASTM E1951-14(2019) - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
November 1, 2019 - ASTM International

4.1 These methods can be used to determine magnifications as viewed through the eyepieces of light microscopes. 4.2 These methods can be used to calibrate microscope magnifications for photography, video systems, and projection stations. 4.3 Reticles may be calibrated as independent...

ASTM E1951-01 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
December 10, 2001 - ASTM International

1.1 This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material...

ASTM E1951-98 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
December 10, 2001 - ASTM International

1.1 This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material...

ASTM F728 - Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
June 26, 1981 - ASTM

This practice covers the preparation of an optical microscope for dimensional measurements. It is intended for preparing an optical microscope to measure the width of lines, in the range from 0.5 to 12 µm, inclusive, on hardsurface photomasks and processed silicon wafers. This...

ASTM F728-81(1997)e1 - Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
January 1, 1987 - ASTM International

1.1 This practice covers the preparation of an optical microscope for dimensional measurements. It is intended for preparing an optical microscope to measure the width of lines, in the range from 0.5 to 12 [mu]m, inclusive, on hard-surface photomasks and processed silicon wafers. 1.2...

ASTM E1951 - Standard Guide for Calibrating Reticles and Light Microscope Magnifications
November 1, 2014 - ASTM

This guide covers methods for calculating and calibrating microscope magnifications, photographic magnifications, video monitor magnifications, grain size comparison reticles, and other measuring reticles. Reflected light microscopes are used to characterize material microstructures....

MIL-M-37869 - MICROSCOPE, OPTICAL, BINOCULAR
April 28, 1978 - NPFC

This specification covers a quadruple nosepiece, inclined binocular microscope with a built-in variable light source.

ASME B1.11 - Microscope Objective Thread
January 1, 1958 - ASME

This standard covers the screw thread used for mounting the objective assembly to the body or lens turret of microscopes. It is based on, and intended to be interchangeable with, the screw thread introduced and adopted many years ago by the Royal Microscopical Society of Great Britain,...

A-A-54386 - MICROSCOPE, OPTICAL (BINOCULAR, BRIGHTFIELD)
April 22, 1991 - NPFC

The General Services Administration has authorized the use of this Commercial Item Description. This Commercial Item Description covers a brightfield binocular microscope for histopathological and pathological studies for use inside medical laboratories and for outside field use.

ISO 27911 - Surface chemical analysis - Scanningprobe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
August 1, 2011 - ISO

This International Standard describes a method for determining the spatial (lateral) resolution of an apertured near-field scanning optical microscope (NSOM) by imaging an object with a size much smaller than the expected resolution. It is applicable to aperture-type NSOMs operated in the...

JIS B 7148 - Microscope eyepieces
February 1, 1992 - JSA
A description is not available for this item.
A-A-54970 - MICROSCOPE, OPTICAL
NPFC
A description is not available for this item.
NNN-S-450 - SLIDE, MICROSCOPE
NPFC
A description is not available for this item.
MS 36148 - DESK, MICROSCOPE
NPFC
A description is not available for this item.
A-A-50831 - SLIDE, MICROSCOPE
NPFC
A description is not available for this item.
ASTM F728-81(2003) - Standard Practice for Preparing An Optical Microscope for Dimensional Measurements (Withdrawn 2003)
June 26, 1981 - ASTM International

This standard was transferred to SEMI (www.semi.org) May 2003 1.1 This practice covers the preparation of an optical microscope for dimensional measurements. It is intended for preparing an optical microscope to measure the width of lines, in the range from 0.5 to 12 [mu]m, inclusive,...

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