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ASTM E1172 - Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
June 1, 2016 - ASTM

This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each...

IEEE 759 - Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
January 1, 1984 - IEEE

(This Foreword is not a part of ANSI/IEEE Std 759-1984, IEEE Standard Test Procedures for Semiconductor Energy X-Ray Spectrometers.) This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a...

IEC 60759 - Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
January 1, 1983 - IEC

This standard presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer. Test procedures for pulse-height...

ASTM F1375 - Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
February 15, 1992 - ASTM

This test method establishes a procedure for comparing the elemental composition of normal surfaces with any defects found on the surfaces of metal tubing, fittings, valves, or any metal component. This test method applies to all steel surfaces of components such as tubings, connectors, regulators,...

DIN ISO 15632 - Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
November 1, 2015 - DIN

This International Standard defines the most important quantities that characterize an energy-dispersive Xray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts. This International Standard is only...

ISO 15632 - Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microanalysis
August 1, 2012 - ISO

This International Standard defines the most important quantities that characterize an energy-dispersive X-ray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts. This International Standard is only...

ASTM E902 - Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
April 1, 2005 - ASTM

This practice covers a procedure for checking some of the operating characteristics of an X-ray photoelectron spectrometer. Tests herein provide checks of the repeatability of intensity measurements and the drift of the intensities with time. This practice may be conducted at...

CEI 45-35 - Standard test procedures for semiconductors X-ray energy spectrometers
September 1, 1997 - CEI

La Normadescrive i metodi di prova normalizzati per gli spettrometri per raggi X a semiconduttore. La presente Norma costituisce la ristampa senza modifiche, secondo il nuovo progetto di veste editoriale, della Norma pari numero ed edizione (Fascicolo 1011).

ASTM E2108 - Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
November 1, 2016 - ASTM

This practice describes a procedure for calibrating the electron binding-energy (BE) scale of an X-ray photoelectron spectrometer that is to be used for performing spectroscopic analysis of photoelectrons excited by unmonochromated aluminum or magnesium Kα X-rays...

ISO 15472 - Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales
May 1, 2010 - ISO

This International Standard specifies a method for calibrating the binding-energy scales of X-ray photoelectron spectrometers, for general analytical purposes, using unmonochromated Al or Mg X-rays or monochromated Al X-rays. It is only applicable to...

ASTM E1217 - Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
November 1, 2011 - ASTM

This practice describes methods for determining the specimen area contributing to the detected signal in Auger electron spectrometers and some types of X-ray photoelectron spectrometers when this area is defined by the electron collection lens and aperture system of the...

ISO 16129 - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
November 1, 2018 - ISO

This document is designed to allow the user to assess, on a regular basis, several key parameters of an Xray photoelectron spectrometer. It is not intended to provide an exhaustive performance check, but instead provides a rapid set of tests that can be conducted frequently....

ISO TR 18231 - Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
May 1, 2016 - ISO

This Technical Report describes methods of test that can be applied to wavelength dispersive X-ray fluorescence (WD-XRF) spectrometers to ensure that the spectrometers are functioning in a manner that allows precise analyses to be made. The tests outlined are designed to...

IEEE 1131 - STANDARD CRYOSTAT END-CAP DIMENSIONS FOR GERMANIUM SEMICONDUCTOR GAMMA-RAY SPECTROMETERS
December 10, 1987 - IEEE
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