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This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical...
This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical...
IEC 60444-8:2016(E) describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent...
This International Standard applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control, selection and optical applications.
This International Standard applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control, selection and optical applications
4.1 Corrosion film growth with thicknesses varying from a monolayer of atoms up to 1 μm can readily be measured on a continuous, real-time, in-situ, basis with QCMs. 4.2 The test results obtained for this test method are influenced by various factors, including geometrical effects, temperature,...
1.1 This laboratory practice covers the quantitative determination of surface deposits produced during the thermal oxidation of gas turbine fuels by monitoring the oscillation frequency of a quartz crystal during thermal exposure. In this practice, "thermal oxidative stability" refers...
IEC 60758:2008(E) applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection. This fourth edition cancels and replaces the third edition, published in 2004. This edition constitutes a technical revision. It...
This standard applies to activity and frequency dips for quartz crystal units over a temperature range.
This part of IEC 60122 specifies the outline drawing for quartz crystal units with lead enclosures.
This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise...
