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IEC 60255-8 - Electrical relays - Part 8: Thermal electrical relays
September 1, 1990 - IEC

Scope and object This standard is applicable to dependent specified time electrical measuring relays which protect equipment from electrical thermal damage by the measurement of current flowing in the protected equipment. This standard covers the following two types of relays: a)...

BS EN 60255-8 - Electrical Relays - Part 8: Thermal Electrical Relays
November 15, 1998 - BSI

Applies to dependent specified time relays which protect equipment, including motors, from electrical thermal damage. To be read in conjunction with BS EN 60255

DS/EN 62194 - Method of evaluating the thermal performance of enclosures
November 2, 2005 - DS

Provides a method of thermal performance evaluation for empty indoor enclosures according to EN 60917 and EN 60297, and, for outdoor enclosures according to EN 61969. Provides criteria to determine the thermal absorption factors relating to principles of enclosure design; internal...

IEC 62194 - Method of evaluating the thermal performance of enclosures
August 1, 2005 - IEC

This International Standard provides a method of thermal performance evaluation for empty indoor enclosures according to IEC 60917 and IEC 60297, and, for outdoor enclosures according to IEC 61969. This standard contains criteria to determine the thermal absorption factors relating to...

IEC 60255-149 - Measuring relays and protection equipment – Part 149: Functional requirements for thermal electrical relays
July 1, 2013 - IEC

This part of the IEC 60255 series specifies minimum requirements for thermal protection relays. This standard includes specification of the protection function, measurement characteristics and test methodologies. The object of this standard is to establish a common and reproducible reference...

DS/EN 60255-149 - Measuring relays and protection equipment - Part 149: Functional requirements for thermal electrical relays
October 9, 2013 - DS

IEC 60255-149:2013 specifies minimum requirements for thermal protection relays. This standard includes specification of the protection function, measurement characteristics and test methodologies. The object is to establish a common and reproducible reference for evaluating dependent time...

CEI EN 60255-149 - Measuring relays and protection equipment Part 149: Functional requirements for thermal electrical relays
October 1, 2014 - CEI

This part of the IEC 60255 series specifies minimum requirements for thermal protection relays. This standard includes specification of the protection function, measurement characteristics and test methodologies. The object of this standard is to establish a common and reproducible reference...

JEDEC JESD 24-3 - Thermal Impedance Measurements for Vertical Power MOSFETs (Delta Source-Drain Voltage Method)
November 1, 1990 - JEDEC

The purpose of this test method is to measure the thermal impedance of the MOSFET under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity if the forward voltage drop of the source-drain is used as the junction temperature indicator. This...

JEDEC JESD 24-4 - Thermal Impedance Measurements for Bipolar Transistors (Delta Base- Emitter Voltage Method)
November 1, 1990 - JEDEC

The purpose of this test method is to measure the thermal impedance of the Bipolar Transistor under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the base-emitter voltage is used as the junction temperature indicator. This test method...

IEC 62951-5 - Semiconductor devices – Flexible and stretchable semiconductor devices – Part 5: Test method for thermal characteristics of flexible materials
February 1, 2019 - IEC

This part of IEC 62951 specifies the test method for thermal characteristics of flexible materials. This document includes terms, definitions, symbols, and test methods that can be used to evaluate and determine thermal characteristics of flexible materials for practical use. The...

ASTM F29-97(2022) - Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
May 1, 2022 - ASTM International

This specification covers the properties and requirements for round, copper-coated 42 % nickel-iron wire, commonly known as dumet, intended primarily for sealing to soft glass. The wires shall conform to requirements stated for chemical composition, oxide coatings, dimension, internal and surface...

ASTM F1320-01(2006) - Standard Test Method for Evaluating Thermal Paper Employing a Facsimile Thermal Printer as a Test Instrument
June 1, 2006 - ASTM International

This test method will permit the user to make comparisons of image quality and machine performance for thermal paper. This test method is not intended for manufacturing control testing. This test method is designed to test only thermal papers designed for use with facsimile machines....

ASTM F1320 - Standard Test Method for Evaluating Thermal Paper Employing a Facsimile Thermal Printer as a Test Instrument
January 10, 2001 - ASTM

This test method covers a standardized procedure utilizing the facsimile thermal printer as an imaging device for measuring the performance properties of direct thermal paper. This test method may also be used to evaluate some imaging properties of facsimile printers. This standard...

ASTM F1320-92(1996) - Standard Test Method for Evaluating Thermal Paper Employing a Facsimile Thermal Printer as a Test Instrument
January 10, 2001 - ASTM International

1.1 This test method covers a standardized procedure utilizing the facsimile thermal printer as an imaging device for measuring the performance properties of direct thermal paper. 1.2 This test method may also be used to evaluate some imaging properties of facsimile printers. 1.3 This...

ASTM F1320-01 - Standard Test Method for Evaluating Thermal Paper Employing a Facsimile Thermal Printer as a Test Instrument
January 10, 2001 - ASTM International

1.1 This test method covers a standardized procedure utilizing the facsimile thermal printer as an imaging device for measuring the performance properties of direct thermal paper. 1.2 This test method may also be used to evaluate some imaging properties of facsimile printers. 1.3 This...

CSA E60730-2-3 - Automatic electrical controls for household and similar use — Part 2-3: Particular requirements for thermal protectors for ballasts for tubular fluorescent lamps
January 1, 2020 - CSA

Requirements concerning the testing of the combination of ballast and thermal protectors are given in CAN/CSA-E61347-1 and CSA C22.2 No. 74. This Standard applies to the safety of such equipment designed and constructed for installation and use in accordance with CSA C22.1, Canadian...

ASTM F1320-01(2011) - Standard Test Method for Evaluating Thermal Paper Employing a Facsimile Thermal Printer as a Test Instrument (Withdrawn 2020)
October 1, 2011 - ASTM International

1.1 This test method covers a standardized procedure utilizing the facsimile thermal printer as an imaging device for measuring the performance properties of direct thermal paper. 1.2 This test method may also be used to evaluate some imaging properties of facsimile printers. 1.3 This...

DS/EN 62258-6 - Semiconductor die products - Part 6: Requirements for information concerning thermal simulation
September 24, 2007 - DS

This part of IEC 62258 has been developed to facilitate the production, supply and use of semiconductor die products, including: - wafers; - singulated bare die; - die and wafers with attached connection structures; - minimally or partially encapsulated die and wafers. This part of IEC 62258...

ASTM F29-97(2017) - Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
June 1, 2017 - ASTM International

This specification covers the properties and requirements for round, copper-coated 42 % nickel-iron wire, commonly known as dumet, intended primarily for sealing to soft glass. The wires shall conform to requirements stated for chemical composition, oxide coatings, dimension, internal and surface...

IEC 62258-6 - Semiconductor die products – Part 6: Requirements for information concerning thermal simulation
August 1, 2006 - IEC

This part of IEC 62258 has been developed to facilitate the production, supply and use of semiconductor die products, including: • wafers; • singulated bare die; • die and wafers with attached connection structures; • minimally or partially encapsulated die and wafers. This part of IEC 62258...

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