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MIL-E-1/1134 - ZENER DIODE, TYPE 1N429
NPFC
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IEEE C62.59 - Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
September 5, 2019 - IEEE

This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems. The technology types covered are: - Forward biased diodes - Zener...

Troubleshooting Electronic Circuits: A Guide to Learning Analog Electronics
January 1, 2020 - MCGRAW

Abstract: This hands-on guide shows, step by step, how to understand and troubleshoot a wide range of analog electronic circuits. Written by electronics guru Ronald Quan, Troubleshooting Electronic Circuits: A Guide to Learning Analog Electronics clearly explains proper debugging techniques as well...

ASTM F448-18 - Standard Test Method for Measuring Steady-State Primary Photocurrent
March 1, 2018 - ASTM International

5.1 PN Junction Diode-The steady-state photocurrent of a simple p-n junction diode is a directly measurable quantity that can be directly related to device response over a wide range of ionizing radiation. For more complex devices the junction photocurrent may not be directly related...

JEDEC JESD 211 - Zener and Voltage Regulator Diode Rating Verification and Characterization Testing
December 1, 2009 - JEDEC

This standard is applicable to diodes that are used as voltage regulators and voltage references. It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. Voltage regulator diodes are sometimes used as transient voltage...

IEEE C62.42.3 - Guide for the Application of Surge Protective Components in Surge Protective Devices and Equipment Ports-Part 3: Silicon PN-Junction
March 23, 2017 - IEEE

The IEEE C62.42™ guide series covers surge protective components (SPCs) used in power and telecom surge protective devices (SPDs) and equipment ports. This part, Part 3 of the series, describes Silicon PN-Junction Clamping Diode SPCs and covers: - Technology variants - Forward biased...

ITU-T K.129 - Characteristics and ratings of silicon PN junction voltage clamping components used for the protection of telecommunication installations
January 1, 2018 - ITU-T

Silicon PN-junction surge protective components (SPCs) are special silicon diodes designed to limit overvoltages and divert surge currents by a voltage clamping action. This Recommendation applies to silicon PN-junction SPCs used in surge protective devices (SPDs) and telecommunication...

ASTM F448-11 - Test Method for Measuring Steady-State Primary Photocurrent
June 1, 2011 - ASTM International

PN Junction Diode-The steady-state photocurrent of a simple p-n junction diode is a directly measurable quantity that can be directly related to device response over a wide range of ionizing radiation. For more complex devices the junction photocurrent may not be directly related to...

ASTM F448-99(2005) - Test Method for Measuring Steady-State Primary Photocurrent
January 1, 2005 - ASTM International

The steady-state photocurrent of a simple p-n junction diode is a directly measurable quantity that can be directly related to device response over a wide range of ionizing radiation. For more complex devices the junction photocurrent may not be directly related to device response....

Introductory Circuits
January 1, 2008 - WILEY

Compact but comprehensive, this textbook presents the essential concepts of electronic circuit theory. As well as covering classical linear theory involving resistance, capacitance and inductance it treats practical nonlinear circuits containing components such as operational amplifiers,...

DSF/PREN IEC 61643-322 - Components for low-voltage surge protection – Part 322: Selection and application principles for silicon PN-junction voltage limiters
DS

This part of IEC 61643 is applicable to silicon PN-junction voltage limiters (overvoltage protectors) used in power and information & communication technology (ICT) systems surge protective devices (SPDs) and equipment ports with nominal system voltages up to AC 1 000 V (RMS) and DC 1 500 V. This...

Semiconductor Materials
December 13, 1996 - CRC

Semiconductor Materials presents physico-chemical, electronic, electrical, elastic, mechanical, magnetic, optical, and other properties of a vast group of elemental, binary, and ternary inorganic semiconductors and their solid solutions. It also discusses the properties of organic semiconductors....

MIL-S-19500 - SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
April 15, 1994 - NPFC

This specification establishes the general requirements for semiconductor devices. Detail requirements and characteristics are specified in the detail specification. Four levels of product assurance requirements for encapsulated devices are provided for in this specification, differentiated by the...

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