Narrow Your Results
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was...
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and...
Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical,...
This text on electron microscopy in viral diagnosis is an invaluable reference investigators interested in the detection of viruses or viral subcomponents in liquid preparations or in thin sectioned cells. It contains an extensive collection of negative stain, thin section, and...
This International Standard defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also...
While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations...
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current...
This document prescribes a method for the determination of apparent growth direction by transmission electron microscopy. It is applicable to all kinds of wirelike crystalline materials fabricated by various methods. This document can also guide in ascertaining an axis direction of...
STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique. Authors: Dr Robert Keyse, Anthony J....
Details the essential practical steps which must precede microscopy. Methods for preparing sheet or disc specimens and final thinning techniques are described with reference to practical problems. The book also covers methods for mounting specimens in the Author: PJ Goodhew
