Leakage Current Standards

00943b-000000-000000 1 Scope 1.1 These requirements cover appliance leakage-current interrupters (ALCIs), intended for use only in 2- or 3- wire alternating-current circuits wherein one of the wires is grounded in accordance with the National Electrical Code, ANSI/NFPA 70. They...

001010-000000-000000 2 Scope 2.1 This sStandard applies to cord- and plug-connected household and similar utilization equipment (see Definitions, Section 3) typically rated 2050 A or less, nominal 50 or 60 Hz, having 3-wire (including equipment grounding conductor) or 2-wire cords, and intended for...

1.1 This test method covers the measurement of MOSFET (Note 1) drain leakage current. Note 1-MOS is an acronym for metal-oxide semiconductor; FET is an acronym for field-effect transistor. 1.2 This test method is applicable to all enhancement-mode and depletion-mode MOSFETs. This test...

This test method covers the measurement of MOSFET (Note 1) drain leakage current. NOTE 1 - MOS is an acronym for metal-oxide semiconductor; FET is an acronym for field-effect transistor. This test method is applicable to all enhancement-mode and depletion-mode MOSFETs. This test...

1.1 This test method covers the measurement of MOSFET (Note 1) drain leakage current. Note 1-MOS is an acronym for metal-oxide semiconductor; FET is an acronym for field-effect transistor. 1.2 The test method is applicable to all enhancement-mode and depletion-mode MOSFETs. The test...

1. Scope 1.1 This test method covers the measurement of leakage currents of transistors and diodes. Electronic devices exposed to ionizing radiation may show increases in leakage current as the accumlated total dose rises. 1.2 These procedures are intended for the...

1.1 This test method covers the measurement of MOSFET (Note 1) drain leakage current. Note 1-MOS is an acronym for metal-oxide semiconductor; FET is an acronym for field-effect transistor. 1.2 This test method is applicable to all enhancement-mode and depletion-mode MOSFETs. This test...

1.1 This test method covers the measurement of leakage currents of transistors and diodes. Electronic devices exposed to ionizing radiation may show increases in leakage current as the accumlated total dose rises. 1.2 These procedures are intended for the measurement of...

1. Scope 1.1 This test method covers the measurement of leakage currents of transistors and diodes. These procedures are intended for the measurement of currents in the range from 10−11 to 10−3 A. 1.2 This test method may be used with either a virtual-ground current...

This part of IEC 60695 describes test methods which measure corrosion damage effects, on targets, of fire effluent from the combustion of test specimens. Both leakage current and metal loss can be measured by using appropriate targets. The decomposition model used in this technical...

This Specification refers to current leakage monitors which are fitted to insulating poles which comply with IEC 855. The purpose of the monitor is to warn if the currents above a preset threshold are flowing along the surface of an insulating pole when the pole is being used.

PREFACE Section One of this publication reproduces in tabular form the limits of interference recommended by C.I.S.P.R. for national adoption. The full texts of the relevant C.I.S.P.R. Recommendations are given in C.I.S.P.R. Publication 7, 7A and 7B. The texts of the recommendations concerning the...

This part of IEC 61557 defines special performance requirements for hand-held and handmanipulated current clamps and sensors for measurement of leakage currents in electrical distribution systems up to 1 000 V a.c. and 1 500 V d.c., taking into account the influence of high...

This part of IEC 61557 defines special performance requirements for hand-held and handmanipulated current clamps and sensors for measurement of leakage currents in electrical distribution systems up to 1 000 V a.c. and 1 500 V d.c., taking into account the influence of high...