Narrow Your Results
1.1 This practice covers tests used to evaluate the performance and to list certain descriptive specifications of a refractive index (RI) detector used as the detection component of a liquid chromatographic (LC) system. 1.2 This practice is intended to describe the performance of the...
1.1 This practice covers tests used to evaluate the performance and to list certain descriptive specifications of a refractive index (RI) detector used as the detection component of a liquid chromatographic (LC) system. 1.2 This practice is intended to describe the performance of the...
1.1 This practice is intended to describe tests used to evaluate the performance and to list certain descriptive specifications of a refractive index (RI) detector used as the detection component of a liquid chromatographic (LC) system. 1.2 This practice is intended to describe the...
1.1 This practice is intended to describe tests used to evaluate the performance and to list certain descriptive specifications of a refractive index (RI) detector used as the detection component of a liquid chromatographic (LC) system. 1.2 This practice is intended to describe the...
1.1 This practice covers tests used to evaluate the performance and to list certain descriptive specifications of a refractive index (RI) detector used as the detection component of a liquid chromatographic (LC) system. 1.2 This practice is intended to describe the performance of the...
1. Scope 1.1 This test method covers the measurement by ellipsometry of the thickness and refractive index of an insulator grown or deposited on a silicon substrate. 1.2 This test method uses monochromatic light. 1.3 This test method is nondestructive and may be used to measure the...
1.1 This test method covers the measurement by ellipsometry of the thickness and refractive index of an insulator grown or deposited on a silicon substrate. 1.2 This test method uses monochromatic light. 1.3 This test method is nondestructive and may be used to measure the thickness...
This standard was transferred to SEMI (www.semi.org) May 2003 1.1 This test method covers the measurement by ellipsometry of the thickness and refractive index of an insulator grown or deposited on a silicon substrate. 1.2 This test method uses monochromatic light. 1.3 This test...
This part of ISO 17901 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of...
5.1 Sodars have found wide applications for the remote measurement of wind and turbulence profiles in the atmosphere, particularly in the gap between meteorological towers and the lower range gates of wind profiling radars. The sodar's far field acoustic power is also used for refractive...
1.1 This test method describes a procedure necessary to permit a user to easily verify that a laser diffraction particle sizing instrument is operating within tolerance limit specifications, for example, such that the instrument accuracy is as stated by the manufacturer. The recommended calibration...
1.1 This test method describes a procedure necessary to permit a user to easily verify that a laser diffraction particle sizing instrument is operating within tolerance limit specifications, for example, such that the instrument accuracy is as stated by the manufacturer. The recommended calibration...
5.1 Sodars have found wide applications for the remote measurement of wind and turbulence profiles in the atmosphere, particularly in the gap between meteorological towers and the lower range gates of wind profiling radars. The sodar's far field acoustic power is also used for refractive...
Sodars have found wide applications for the remote measurement of wind and turbulence profiles in the atmosphere, particularly in the gap between meteorological towers and the lower range gates of wind profiling radars. The sodar's far field acoustic power is also used for refractive...
INTRODUCTION This Item provides a computerized method for predicting pure jet flyover noise spectra from noise spectra measured from, or predicted for, a stationary jet. The changes in noise levels from static to flight conditions are often referred to as static-to-flight effects. The computational...