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IEC 60749-9

Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking

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Organization: IEC
Publication Date: 1 March 2017
Status: active
Page Count: 14
ICS Code (Semiconductor devices in general): 31.080.01
scope:

The purpose of this part of IEC 60749 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.

This test is applicable for all package types. It is suitable for use in qualification and/or process monitor testing. The test is considered non-destructive. Electrical or mechanical rejects can be used for the purpose of this test.

NOTE 1 This procedure does not apply to laser branded packages.

Many available solvents that could be used are either not sufficiently active, too stringent, or even dangerous to humans when in direct contact or when fumes are inhaled.

NOTE 2 The composition of solvents used in this document is considered typical and representative of the desired stringency as far as the usual coatings and markings are concerned.

Document History

IEC 60749-9
March 1, 2017
Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking
The purpose of this part of IEC 60749 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of...
August 1, 2003
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 9: Permanence of Marking CORRIGENDUM 1
A description is not available for this item.
April 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
A description is not available for this item.

References

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