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BSI - BS EN 60749-3

Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination

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Organization: BSI
Publication Date: 30 November 2017
Status: active
Page Count: 18
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN 60749-3
November 30, 2017
Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination
A description is not available for this item.
August 27, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 3: External Visual Examination
A description is not available for this item.

References

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