BSI - BS EN 60749-11
CORR 1 Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method
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| Organization: | BSI |
| Publication Date: | 24 September 2002 |
| Status: | active |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN 60749-11
September 24, 2002
CORR 1 Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method
A description is not available for this item.
September 24, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method
A description is not available for this item.
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