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BSI - BS EN 60749-11

CORR 1 Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method

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Organization: BSI
Publication Date: 24 September 2002
Status: active
Page Count: 12
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN 60749-11
September 24, 2002
CORR 1 Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method
A description is not available for this item.
September 24, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method
A description is not available for this item.

References

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