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DOD - SMD 5962-97636

MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 17 January 2018
Status: active
Page Count: 12
scope:

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD 5962-97636
January 17, 2018
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
February 9, 2007
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC silicon
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 22, 1997
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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