CENELEC - EN IEC 60749-12
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
active, Most Current
Organization: | CENELEC |
Publication Date: | 1 March 2018 |
Status: | active |
Page Count: | 12 |
ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.
NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.
Document History

EN IEC 60749-12
March 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It...

August 1, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 12: Vibration, Variable Frequency
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