JEDEC JEP 121
Requirements for Microelectronic Screening and Test Optimization
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| Organization: | JEDEC |
| Publication Date: | 1 October 2006 |
| Status: | active |
| Page Count: | 36 |
scope:
The purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.
Document History
September 1, 2020
Requirements for Microelectronic Screening and Test Optimization
This document defines the methodology for the optimization (elimination, reduction, or alternative approach) of the screening and testing requirements for MIL-PRF-38535 Microcircuits. Inherent in...
JEDEC JEP 121
October 1, 2006
Requirements for Microelectronic Screening and Test Optimization
The purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in...
April 1, 1995
Guidelines for MIL-STD-883, Screening and QCI Optimization
A description is not available for this item.
January 1, 1995
Guidelines for MIL-STD-883 Screening and QCI Optimization
A description is not available for this item.
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