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IEC 62951-3

Semiconductor devices – Flexible and strechable semiconductor devices – Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

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Organization: IEC
Publication Date: 1 November 2018
Status: active
Page Count: 26
ICS Code (Other semiconductor devices): 31.080.99
scope:

This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.

Document History

IEC 62951-3
November 1, 2018
Semiconductor devices – Flexible and strechable semiconductor devices – Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates,...

References

This document references:
60747-8 - Semiconductor devices – Discrete devices – Part 8: Field-effect transistors
Published by IEC on June 1, 2021
This part of IEC 60747 gives standards for the following categories of field-effect transistors: – type A: junction-gate type; – type B: insulated-gate depletion (normally on) type; – type C:...
This document references:
IEC 62047-17 - Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
Published by IEC on March 1, 2015
This part of IEC 62047 specifies the method for performing bulge tests on the free-standing film that is bulged within a window. The specimen is fabricated with micro/nano structural film materials,...
This document is referenced by:
20/30399381 DC - Draft BS IEC 62899-503-2 Printed electronics Part 503-2: Quality assessment - Test method for Electrical characterization of Roll-toroll printed TFT active matrix
Published by BSI on March 9, 2020
A description is not available for this item.
This document is referenced by:
BS IEC 62951-8 - Semiconductor devices - Flexible and stretchable semiconductor devices Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
Published by BSI on January 31, 2023
A description is not available for this item.
This document is referenced by:
62951-8 - Semiconductor devices – Flexible and stretchable semiconductor devices – Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
Published by IEC on January 1, 2023
This part of IEC 62951 defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include...
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