BSI - BS EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods Part 41: Standard reliability testing methods of non-volatile memory devices
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| Organization: | BSI |
| Publication Date: | 30 September 2020 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN IEC 60749-41
September 30, 2020
Semiconductor devices - Mechanical and climatic test methods Part 41: Standard reliability testing methods of non-volatile memory devices
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