BSI - BS EN IEC 60749-30
Semiconductor devices — Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
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| Organization: | BSI |
| Publication Date: | 30 September 2020 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN IEC 60749-30
September 30, 2020
Semiconductor devices — Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
January 27, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
January 27, 2006
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of nonhermetic surface mount devices prior to reliability testing
A description is not available for this item.