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DLA - DSCC-VID-V62/10613 REV D

MICROCIRCUIT, LINEAR, LOW NOISE, LOW DRIFT, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 2 September 2021
Status: active
Page Count: 10
scope:

Scope.

This drawing documents the general requirements of a low noise, low drift, precision voltage reference microcircuit, with an operating temperature range of -55°C to +125°C.

Document History

DSCC-VID-V62/10613 REV D
September 2, 2021
MICROCIRCUIT, LINEAR, LOW NOISE, LOW DRIFT, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON
Scope. This drawing documents the general requirements of a low noise, low drift, precision voltage reference microcircuit, with an operating temperature range of -55°C to +125°C.
DSCC-VID-V62/10613 REV C
June 1, 2016
MICROCIRCUIT, LINEAR, LOW NOISE, LOW DRIFT, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents the general requirements of a low noise, low drift, precision voltage reference microcircuit, with an operating temperature range of -55°C to +125°C.
DSCC-VID-V62/10613 REV B
November 17, 2010
MICROCIRCUIT, LINEAR, LOW NOISE, LOW DRIFT, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents the general requirements of a low noise, low drift, precision voltage reference microcircuit, with an operating temperature range of -55°C to +125°C.
DSCC-VID-V62/10613 REV A
August 19, 2010
MICROCIRCUIT, LINEAR, LOW NOISE, LOW DRIFT, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents the general requirements of a low noise, low drift, precision voltage reference microcircuit, with an operating temperature range of -55°C to +125°C.
DSCC-VID-V62/10613
May 11, 2010
MICROCIRCUIT, LINEAR, LOW NOISE, LOW DRIFT, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents the general requirements of a low noise, low drift, precision voltage reference microcircuit, with an operating temperature range of -55°C to +125°C.

References

This document references:
JEDEC JEP 155 - Recommended ESD Target Level for HBM Qualification
Published by JEDEC on July 1, 2018
The intent of this report is to document and provide critical information to assess and make decisions on safe ESD level requirements. The scope of this document is to provide this information to...
This document references:
JEP157A - Recommended ESD-CDM Target Levels
Published by JEDEC on April 1, 2022
The intent of this report is to document and provide critical information to assess and make decisions on safe CDM ESD level requirements. The scope of this document is to provide this information to...
This document references:
JS-001 - Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) - Device Level
Published by JEDEC on May 1, 2023
This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a...
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