BSI - BS EN IEC 60749-10 - TC
Tracked Changes (Redline) - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
active, Most Current
| Organization: | BSI |
| Publication Date: | 15 September 2022 |
| Status: | active |
| Page Count: | 38 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN IEC 60749-10 - TC
September 15, 2022
Tracked Changes (Redline) - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
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