DLA - MIL-STD-750-2B CHANGE 1
TEST METHOD STANDARD MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999
| Organization: | DLA |
| Publication Date: | 23 June 2023 |
| Status: | active |
| Page Count: | 329 |
scope:
Purpose.
Part 2 of this test method standard establishes uniform test methods for the mechanical testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related devices. This part of a multipart test method standard is intended to apply only to semiconductor devices.
Numbering system.
The test methods are designated by numbers assigned in accordance with the following system.
Classification of tests.
The mechanical test methods included in this part of a multipart test method standard are numbered 2005 to 2103 inclusive.
Test method revisions.
Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 2005.2 is the second revision of test method 2005.
Method of reference.
When applicable, test methods contained herein should be referenced in the individual specification or specification sheet by specifying the test method number and the details required in the summary of the applicable test method should be listed. To avoid the necessity for changing documents that refer to test methods of this standard, the revision number should not be used when referencing test methods. (For example: Use 2005 versus 2005.2.)
intended Use:
The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in... View More
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