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BSI - BS PD IEC/TS 62132-9

Integrated circuits — Measurement of electromagnetic immunity Part 9: Measurement of radiated immunity — Surface scan method

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Organization: BSI
Publication Date: 30 September 2014
Status: active
Page Count: 32
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS PD IEC/TS 62132-9
September 30, 2014
Integrated circuits — Measurement of electromagnetic immunity Part 9: Measurement of radiated immunity — Surface scan method
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References

This document references:
IEC TS 61967-3 - Integrated circuits – Measurement of electromagnetic emissions – Part 3: Measurement of radiated emissions – Surface scan method
Published by IEC on August 1, 2014
This part of IEC 61967 provides a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit...
This document references:
IEC 61967-6 - Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
Published by IEC on June 1, 2008
This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This...
This document references:
IEC 62132-1 - Integrated circuits – Measurement of electromagnetic immunity – Part 1: General conditions and definitions
Published by IEC on October 1, 2015
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
This document references:
IEC TR 61967-1-1 - Integrated circuits – Measurement of electromagnetic emissions – Part 1-1: General conditions and definitions – Near-field scan data exchange format
Published by IEC on August 1, 2015
This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by...
This document references:
IEC TS 61967-3 - Integrated circuits – Measurement of electromagnetic emissions – Part 3: Measurement of radiated emissions – Surface scan method
Published by IEC on August 1, 2014
This part of IEC 61967 provides a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit...
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