DOD - SMD 5962-88520
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE-TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
inactive
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| Organization: | DOD |
| Publication Date: | 8 March 2007 |
| Status: | inactive |
| Page Count: | 26 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
August 28, 2023
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead...
April 13, 2018
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
February 22, 2012
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-88520
March 8, 2007
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE-TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 15, 2005
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE-TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
January 10, 2001
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE-TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits covered by...
July 31, 2000
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE-TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits covered by...
January 25, 2000
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE-TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits covered by...
December 3, 1987
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL D-TYPE POSITIVE EDGE-TRIGGERED FLIP-FLOP, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....