DOD - SMD 5962-08208
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1K X 36 CLOCKED FIFO, 3.3 VOLT, RADIATION-HARDENED, MONOLITHIC SILICON
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| Organization: | DOD |
| Publication Date: | 28 June 2016 |
| Status: | active |
| Page Count: | 22 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
October 17, 2023
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1K X 36 CLOCKED FIFO, 3.3 VOLT, RADIATION-HARDENED, MONOLITHIC SILICON
A description is not available for this item.
SMD 5962-08208
June 28, 2016
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1K X 36 CLOCKED FIFO, 3.3 VOLT, RADIATION-HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
October 22, 2008
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1K X 36 CLOCKED FIFO, 3.3 VOLT, RADIATION-HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...