DSF/PREN 60749-5
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
active, Most Current
Buy Now
| Organization: | DS |
| Status: | active |
| Page Count: | 11 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. . This test method is considered destructive.
Document History
July 10, 2017
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments....
June 6, 2003
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of eveluating the reliability of non-hermetic packaged solid-state devices in humid environments.
DSF/PREN 60749-5
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...