DS/EN 60749-5
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
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| Organization: | DS |
| Publication Date: | 6 June 2003 |
| Status: | inactive |
| Page Count: | 14 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of eveluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Document History
July 10, 2017
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments....
DS/EN 60749-5
June 6, 2003
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of eveluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...
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