DS/EN 60749-5
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
inactive, Most Current
| Organization: | DS |
| Publication Date: | 10 July 2017 |
| Status: | inactive |
| Page Count: | 15 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) correction of an error in an equation; b) inclusion of notes for guidance; c) clarification of the applicability of test conditions.
Document History
DS/EN 60749-5
July 10, 2017
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments....
June 6, 2003
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of eveluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...