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DOD - SMD 5962-97590

MICROCIRCUIT, DIGITAL, ADVANCED SCHOTTKY TTL, OCTAL EDGE TRIGGERED D-TYPE FLIP FLOPS WITH THREE STATE OUTPUTS, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 20 January 2017
Status: active
Page Count: 14
scope:

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

December 7, 2021
MICROCIRCUIT, DIGITAL, ADVANCED SCHOTTKY TTL, OCTAL EDGE TRIGGERED D-TYPE FLIP FLOPS WITH THREE STATE OUTPUTS, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-97590
January 20, 2017
MICROCIRCUIT, DIGITAL, ADVANCED SCHOTTKY TTL, OCTAL EDGE TRIGGERED D-TYPE FLIP FLOPS WITH THREE STATE OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
January 18, 2007
MICROCIRCUIT, DIGITAL, ADVANCED SCHOTTKY TTL, OCTAL EDGE TRIGGERED D-TYPE FLIP FLOPS WITH THREE STATE OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
June 19, 1997
MICROCIRCUIT, DIGITAL, ADVANCED SCHOTTKY TTL, OCTAL EDGE TRIGGERED D-TYPE FLIP FLOPS WITH THREE STATE OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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