DOD - SMD 5962-87571
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
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| Organization: | DOD |
| Publication Date: | 14 May 2007 |
| Status: | inactive |
| Page Count: | 16 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
March 1, 2019
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
January 14, 2013
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
SMD 5962-87571
May 14, 2007
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
May 24, 2002
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
A description is not available for this item.
September 15, 2000
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
April 12, 1999
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
June 18, 1998
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
March 7, 1997
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
December 23, 1992
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
September 21, 1987
MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON
A description is not available for this item.