DOD - SMD 5962-98509
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 28000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
inactive
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| Organization: | DOD |
| Publication Date: | 12 June 2007 |
| Status: | inactive |
| Page Count: | 41 |
scope:
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
April 1, 2016
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 28000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device...
SMD 5962-98509
June 12, 2007
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 28000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
November 6, 1998
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 28000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...