scope:

This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability (T level) tantalum dielectric, fixed, chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current (ac) component is small compared to the direct current (dc) rated voltage and where supplemental moisture protection is available (see 6.1). Long-term exposure to humid conditions may affect the equivalent series resistance of these capacitors and possibly result in damage during solder reflow (see 6.11). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85°C for failure rate levels (FRL) ranging from:

a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRLs are established at a 60-percent confidence level and are maintained at a 10-percent producer's risk (exponential distribution).

b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours at 90-percent confidence level (Weibull distribution).

The high reliability capacitors (T level) require the following: Weibull grading to the C FRL, surge current option C (see table IV), destructive physical analysis, 100 percent radiographic inspection, 100 percent visual inspection, and DC leakage and equivalent series resistance measurements within +3 standard deviations of the lot mean. Inspection of product for delivery for T level capacitors consists of group A and subgroups I, II, and III of group C.

intended Use: