scope:

This specification covers the general requirements for established reliability tantalum, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where. the alternating current (ac) component is small compared to the direct current (dc) rated voltage and where supplemental moisture protection is available (see 6.1). These capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85°C for failure rate (FR) levels ranging from:

a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FR levels are established at a 60-percent confidence level and are maintained at a 10-percent producer's risk (exponential distribution).

b. 0.1 percent per 1,000 hours to 0.0001 percent per 1,000 hours (1 FIT) 1/ at a 90-percent confidence level (Weibull distribution).

A part per million (PPM) quality system is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification. Statistical process control (SPC) techniques are required in the manufacturing process to minimize variation in production of capacitors supplied to this specification.

Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: U.S. Army Laboratory Command, ATTN: SLCET-R-S, Fort Monmouth, NJ 07703-5302, by using the self-addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of document or by letter.

Capacitors covered by this specification are classified by the style, as specified (see 3.1).

The PIN shall be in the following form, and as specified:

The style is identified by the three-letter symbol "CWR", followed by the two digit number; the letters identify established reliability, tantalum, fixed chip capacitors, and the number identifies the design of the capacitor.

The voltage (rated, derated, and surge) is identified by a single letter as shown in table I.

The termination finish is identified by a single letter, as follows:

B - Gold plated (5O microinch minimum). C - Hot solder dipped (60 microinch minimum). E - Tin plated (100 microinch minimum). H - Solder plated (100 microinch minimum). J - Tin fused (60 microinch minimum). K - Solder fused (60 microinch minimum).

See 6.8 for conversion from previous termination finishes.

The nominal capacitance value, expressed in picofarads (pF), is identified by a three-digit number; the first two digits represent significant figures and the third digit specifies the number of zeros to follow.

The capacitance tolerance is identified by a single letter as shown in table II. TABLE II. Capacitance tolerance.

Symbol Capacitance tolerance -------------------------------- Percent (±) J 5 K 10 M 20

The FR level (based on life tests performed at specified voltage) is identified by a single letter as shown in table III.

intended Use:

Tantalum chip capacitors are intended to be used in thin or thick film hybrid circuit or surface mount applications where microcircuitry is indicated.