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NPFC - MIL-PRF-55365

CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR

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Organization: NPFC
Publication Date: 3 July 1997
Status: inactive
Page Count: 36
scope:

This specification covers the general requirements for nonestablished reliability (non-ER) and established reliability (ER), tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current (ac) component is small compared to the direct current (dc), rated voltage and where supplemental moisture protection is available (see 6.1). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85°C for failure rate levels (FRL) ranging from:

a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL's are established at a 60-percent confidence level and are maintained at a 10-percent producer's risk (exponential distribution).

b. 0.1 percent per 1,000 hours to 0.0001 percent per 1,000 hours (1 FIT) at 90-percent confidence level (Weibull distribution). 1/

Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: U.S. Army Communications-Electronics Command and Fort Monmouth, ATTN: AMSEL-LC-LEO-E-EP, Fort Monmouth, NJ 07703-5023, by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of the document or by letter.

Capacitors covered by this specification are classified by style as specified (see 3.1).

The PIN should be in the following form and as specified (see 3.1).

The style is identified by the three-letter symbol "CWR", followed by the two digit number. The letters identify tantalum chip capacitors. The number identifies the design of the capacitor.

The voltage (rated, derated, and surge) is identified by a single letter as shown in table I. TABLE I. Voltage.

Voltage ----------------------------------------------------------------- Symbol Rated (+85°C) Derated (+125°C) Surge (+85°C) ---------------------------------------------------------------------------- Volts, dc Volts, dc Volts, dc A 2 1.3 2.6 B 3 2.0 4.0 C 4 2.7 5.0 D 6 4.0 8.0 E 8 5.4 10.0 F 10 7.0 13.0 G 12 8.0 16.0 H 15 10.0 20.0 J 20 13.0 26.0 K 25 17.0 32.0 L 30 20.0 39.0 M 35 23.0 46.0 N 50 33.0 65.0

The termination finish is identified by a single letter as follows:

B - Gold plated (50 microinch minimum).

C - Hot solder dipped (60 microinch minimum).

H - Solder plated (100 microinch minimum).

K - Solder fused (60 microinch minimum).

At the option of the manufacturer, all termination finishes may have a barrier metal. See 6.8 for conversion from previous termination finishes.

The nominal capacitance value, expressed in picofarads (pF), is identified by a three-digit number. The first two digits represent significant figures and the third digit specifies the number of zeros to follow.

The capacitance tolerance is identified by a single letter as shown in table II. TABLE II. Capacitance tolerance.

Symbol Capacitance tolerance percent(%) -------------------------------------- J 5 K 10 M 20

The product level designator is identified by a single letter as shown in table III.

intended Use:

Tantalum chip capacitors are intended to be used in thin or thick film hybrid circuits or surface mount applications where microcircuitry is indicated.

Document History

February 14, 2022
Capacitor, Fixed, Electrolytic (Tantalum), Chip, Established Reliability, Non-Established Reliability, and High Reliability, General Specification for
A description is not available for this item.
March 24, 2017
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability (T level) tantalum dielectric, fixed, chip capacitors,...
December 21, 2013
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily...
October 18, 2012
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily...
January 9, 2012
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily...
February 18, 2011
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily...
February 4, 2011
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily...
September 16, 2010
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily...
October 3, 2008
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily...
February 26, 2008
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily...
January 30, 2008
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily...
April 16, 2004
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for nonestablished reliability (non-ER) and established reliability (ER), tantalum dielectric, fixed chip capacitors, primarily intended for use in...
May 29, 2003
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for nonestablished reliability (non-ER) and established reliability (ER), tantalum dielectric, fixed chip capacitors, primarily intended for use in...
November 9, 2000
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.
April 13, 1998
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.
MIL-PRF-55365
July 3, 1997
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for nonestablished reliability (non-ER) and established reliability (ER), tantalum dielectric, fixed chip capacitors, primarily intended for use in...
April 21, 1994
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.
August 2, 1993
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.
April 21, 1993
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.
March 5, 1993
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.
July 25, 1991
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.
August 23, 1990
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
This specification covers the general requirements for established reliability tantalum, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount...
March 10, 1987
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.
September 18, 1985
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.
March 25, 1985
CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
A description is not available for this item.

References

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