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DOD - SMD 5962-77049

MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 13 July 2017
Status: active
Page Count: 9
scope:

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD-5962-77049 REV L
January 25, 2023
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.
SMD 5962-77049
July 13, 2017
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-77049 REV J
May 11, 2005
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-77049 REV H
January 15, 2003
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-77049 REV G
July 18, 2000
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-77049 REV F
February 18, 1993
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
SMD-5962-77049 REV E
September 16, 1987
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-77049 REV D
April 17, 1986
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-77049 REV C
May 22, 1985
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-77049 REV B
February 25, 1983
MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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