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ISO 20720

Microbeam analysis - Methods of specimen preparation for analysis of general powders using WDS and EDS

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Organization: ISO
Publication Date: 1 October 2018
Status: active
Page Count: 16
ICS Code (Other standards related to analytical chemistry): 71.040.99
scope:

This document specifies specimen preparation methods for the analysis of particles in powders using energy-dispersive spectrometers (EDS) or wavelength-dispersive spectrometers (WDS) installed on an EPMA or SEM. The preparation methods for powder particle analysis are classified by the analytical purpose and the particle size.

This document applies to inorganic particles larger than 100 nm and smaller than 100 μm in diameter.

It applies only to analysis of "general" powders, which means that it excludes procedures for special applications such as forensic or trace analysis.

Document History

ISO 20720
October 1, 2018
Microbeam analysis - Methods of specimen preparation for analysis of general powders using WDS and EDS
This document specifies specimen preparation methods for the analysis of particles in powders using energy-dispersive spectrometers (EDS) or wavelength-dispersive spectrometers (WDS) installed on an...

References

This document references:
ISO 14594 - Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Published by ISO on October 15, 2014
This International Standard gives the general guidelines for the determination of experimental parameters relating to the primary beam, the wavelength spectrometer, and the sample that need to be...
This document references:
ISO 22489 - Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
Published by ISO on October 15, 2016
This International Standard specifies requirements for the quantification of elements in a micrometresized volume of a specimen identified through analysis of the X-rays generated by an electron beam...
This document references:
ISO 11938 - Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Published by ISO on March 1, 2012
This International Standard provides procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving...
This document references:
ISO 17470 - Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Published by ISO on January 15, 2014
This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a...
This document references:
ISO 22309 - Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
Published by ISO on October 15, 2011
This International Standard gives guidance on the quantitative analysis at specific points or areas of a specimen using energy-dispersive spectrometry (EDS) fitted to a scanning electron microscope...
This document references:
ISO 22493 - Microbeam analysis - Scanning electron microscopy - Vocabulary
Published by ISO on April 15, 2014
This International Standard defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a...
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