TSE - TS EN 60749-23/A1
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
active, Most Current
| Organization: | TSE |
| Publication Date: | 22 November 2011 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
TS EN 60749-23/A1
November 22, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
A description is not available for this item.
April 30, 2008
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Bu standard, zaman icinde kati hal elemanlar uzerindekikutuplama sartlari ve sicaklik etkilerini tayin etmek icinkullanilan deneyi kapsar
December 2, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004)
Bu standard, her biri 10 J’u aşmayan kinetik enerjili, metal olmayan sicim kesme elemanlı veya mil üzerinde serbestçe dönen metal olmayan kesicili, şebeke gerilimiyle çalışan, ayakta duran bir...