TSE - TS EN 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
active
| Organization: | TSE |
| Publication Date: | 30 April 2008 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Bu standard, zaman icinde kati hal elemanlar uzerindekikutuplama sartlari ve sicaklik etkilerini tayin etmek icinkullanilan deneyi kapsar
Document History
November 22, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
A description is not available for this item.
TS EN 60749-23
April 30, 2008
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Bu standard, zaman icinde kati hal elemanlar uzerindekikutuplama sartlari ve sicaklik etkilerini tayin etmek icinkullanilan deneyi kapsar
December 2, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004)
Bu standard, her biri 10 J’u aşmayan kinetik enerjili, metal olmayan sicim kesme elemanlı veya mil üzerinde serbestçe dönen metal olmayan kesicili, şebeke gerilimiyle çalışan, ayakta duran bir...