CEI EN 60749-4
Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
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| Organization: | CEI |
| Publication Date: | 1 October 2017 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
Document History
CEI EN 60749-4
October 1, 2017
Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid...
March 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
La presente Norma internazionale fa parte della serie IEC 60749 e descrive un metodo di prove fortemente accelerate di temperatura ed umidità (HAST).
Lo scopo della prova è quello di valutare...