CEI EN 60749-5
Semiconductor devices - Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test
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| Organization: | CEI |
| Publication Date: | 1 November 2017 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This test method is considered destructive.
Document History
CEI EN 60749-5
November 1, 2017
Semiconductor devices - Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...
October 1, 2005
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
La presente Norma Internazionale fa parte della serie IEC 60749.
Essa fornisce la descrizione di un metodo di prova in condizioni di regime permanente di durata di vita sotto temperatura ed umidità...