CEI EN 62276
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
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| Organization: | CEI |
| Publication Date: | 1 May 2017 |
| Status: | active |
| Page Count: | 48 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators
Document History
CEI EN 62276
May 1, 2017
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
November 1, 2013
Single crystal wafers for surface acoustic wave (SAW) devices applications - Specifications and measuring method
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
October 1, 2006
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
Norma recepita mediante l'annuncio su CEINFORMA settembre/ottobre 2006.