CEI - EN 62276
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
inactive
| Organization: | CEI |
| Publication Date: | 1 October 2006 |
| Status: | inactive |
| Page Count: | 42 |
scope:
Norma recepita mediante l'annuncio su CEINFORMA settembre/ottobre 2006.
Document History
May 1, 2017
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
November 1, 2013
Single crystal wafers for surface acoustic wave (SAW) devices applications - Specifications and measuring method
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
EN 62276
October 1, 2006
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
Norma recepita mediante l'annuncio su CEINFORMA settembre/ottobre 2006.