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CEI - EN 62276

Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods

inactive
Organization: CEI
Publication Date: 1 October 2006
Status: inactive
Page Count: 42
scope:

Norma recepita mediante l'annuncio su CEINFORMA settembre/ottobre 2006.

Document History

May 1, 2017
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
November 1, 2013
Single crystal wafers for surface acoustic wave (SAW) devices applications - Specifications and measuring method
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
EN 62276
October 1, 2006
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
Norma recepita mediante l'annuncio su CEINFORMA settembre/ottobre 2006.
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