NEN-EN-IEC 61967-6/A1
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
active
| Organization: | NEN |
| Publication Date: | 1 June 2008 |
| Status: | active |
| Page Count: | 29 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
Document History
November 1, 2010
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted eissions - Magnetic probe method
A description is not available for this item.
NEN-EN-IEC 61967-6/A1
June 1, 2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
A description is not available for this item.
November 1, 2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted eissions - Magnetic probe method
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of...